'A'
Fast-scanning shear-force microscopy using a high-frequency dithering probe
Seo Y, Park JH, Moon JB, Jhe W
APPLIED PHYSICS LETTERS
77 (26): 4274-4276 DEC 25 2000
Addresses:
Jhe W, Seoul Natl Univ, Ctr Near Field Atom Photon Technol, Seoul 151742, South Korea
Seoul Natl Univ, Ctr Near Field Atom Photon Technol, Seoul 151742, South Korea
Seoul Natl Univ, Dept Phys, Seoul 151742, South Korea
'B'
Novel digital feedback scheme of shear-force control in near-field scanning optical microscopy
Kim KH, Eah SK, Lee B, Chang HC, Jhe WH
REVIEW OF SCIENTIFIC INSTRUMENTS
68 (7): 2783-2786 JUL 1997
Fast-scanning shear-force microscopy using a high-frequency dithering probe
Seo Y, Park JH, Moon JB, Jhe W
APPLIED PHYSICS LETTERS
77 (26): 4274-4276 DEC 25 2000
Addresses:
Jhe W, Seoul Natl Univ, Ctr Near Field Atom Photon Technol, Seoul 151742, South Korea
Seoul Natl Univ, Ctr Near Field Atom Photon Technol, Seoul 151742, South Korea
Seoul Natl Univ, Dept Phys, Seoul 151742, South Korea
'B'
Novel digital feedback scheme of shear-force control in near-field scanning optical microscopy
Kim KH, Eah SK, Lee B, Chang HC, Jhe WH
REVIEW OF SCIENTIFIC INSTRUMENTS
68 (7): 2783-2786 JUL 1997
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