'A'

Fast-scanning shear-force microscopy using a high-frequency dithering probe

Seo Y, Park JH, Moon JB, Jhe W

APPLIED PHYSICS LETTERS

77 (26): 4274-4276 DEC 25 2000

Addresses:

Jhe W, Seoul Natl Univ, Ctr Near Field Atom Photon Technol, Seoul 151742, South Korea

Seoul Natl Univ, Ctr Near Field Atom Photon Technol, Seoul 151742, South Korea

Seoul Natl Univ, Dept Phys, Seoul 151742, South Korea



'B'

Novel digital feedback scheme of shear-force control in near-field scanning optical microscopy

Kim KH, Eah SK, Lee B, Chang HC, Jhe WH

REVIEW OF SCIENTIFIC INSTRUMENTS

68 (7): 2783-2786 JUL 1997