'A'
Title: Simultaneous and independent measurement of stress and temperature using a single field-effect transistor structure
Author(s): Doelle M (Doelle, Michael), Held J (Held, Jochen), Ruther P (Ruther, Patrick), Paul O (Paul, Oliver)
Source: JOURNAL OF MICROELECTROMECHANICAL SYSTEMS 16 (5): 1232-1242 OCT 2007
Authors' addresses:
Silicon Microstruct Inc, Milpitas, CA 95035 USA
Univ Freiburg, Dept Microsyst Engn IMTEK, D-79110 Freiburg, Germany

'B'
Title: Stable, threshold voltage extraction using Tikhonov's regularization theory
Author(s): Choi WY, Kim H, Lee B, Lee JD, Park YG
Source: IEEE TRANSACTIONS ON ELECTRON DEVICES 51 (11): 1833-1839 NOV 2004