'A'
Nanoscopic surface inspection by analyzing the linear polarization degree of the scattered light
Author(s): Albella P (Albella, P.)1, Saiz JM (Saiz, J. M.)1, Sanz JM (Sanz, J. M.)1, Gonzalez E (Gonzalez, E.)1, Moreno E (Moreno, E.)1  
Source: OPTICS LETTERS    Volume: 34    Issue: 12    Pages: 1906-1908    Published: JUN 15 2009  
Addresses:
1. Univ Cantabria, Dept Fis Aplicada, Fac Ciencias, Grp Opt, E-39005 Santander, Spain

'B'
Vector field microscopic imaging of light
Author(s): Lee KG (Lee, K. G.), Kihm HW (Kihm, H. W.), Kihm JE (Kihm, J. E.), Choi WJ (Choi, W. J.), Kim H (Kim, H.), Ropers C (Ropers, C.), Park DJ (Park, D. J.), Yoon YC (Yoon, Y. C.), Choi SB (Choi, S. B.), Woo H (Woo, D. H.), Kim J (Kim, J.), Lee B (Lee, B.), Park QH (Park, Q. H.), Lienau C (Lienau, C.), Kim DS (Kim, D. S.)  
Source: NATURE PHOTONICS    Volume: 1    Issue: 1    Pages: 53-56    Published: JAN 2007